A continuous enchancment program leverages unpatterned wafer defect inspection to identify the specific course of instruments inflicting defects. With a device monitoring CIP in place, automotive fabs can set objective targets for decreasing the process defects that have an result on reliability. McKinsey Center for Future Mobility The McKinsey Center for Future Mobility brings together cross-functional experience to ship leading-edge perception to assist shape the future of mobility-related industries and the basic public sector. We are passionate and curious concerning the rising opportunities in mobility. The highway to reasonably priced autonomous mobility January three, 2022 – Robo-taxis promise inexpensive mobility. …